검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators Urban FK, Barton D Thin Solid Films, 517(3), 1063, 2008 |
| No. | Article |
|---|---|
| 1 |
Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators Urban FK, Barton D Thin Solid Films, 517(3), 1063, 2008 |