검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Carrier Capture as a Mechanism for Defect Migration at Semiconductor Surfaces Lengel G, Weimer M, Gryko J, Allen RE Journal of Vacuum Science & Technology B, 13(3), 1144, 1995 |
| 2 |
Interchain Vacancy Migration of GaAs(110) Lengel G, Weimer M, Gryko J, Allen RE Journal of Vacuum Science & Technology A, 12(4), 1855, 1994 |