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| No. | Article |
|---|---|
| 1 |
Rutherford Backscattering Spectrometry, Particle-Induced X-Ray-Emission and Atomic-Force Microscopy of InAs Thin-Films Grown on GaAs - A Complementary Study Bouhacina T, Aime JP, Barriere AS, Guegan H, Grandjean N, Massies J Thin Solid Films, 278(1-2), 155, 1996 |