검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
Bone Regeneration in Craniofacial Reconstruction with Particulate Grafts Obtained Through Tissue Engineering Lucaciu O, Baciut M, Baciut G, Gheban D, Bran S, Hedesiu M, Nicola C, Soritau O, Gui D Particulate Science and Technology, 27(6), 497, 2009 |
| 2 |
Long-term reproducibility of relative sensitivity factors obtained with CAMECA Wf Gui D, Xing ZX, Huang YH, Mo ZQ, Hua YN, Zhao SP, Cha LZ Applied Surface Science, 255(4), 1427, 2008 |
| 3 |
Roughness development in the depth profiling with 500 eV O-2(+) beam with the combination of oxygen flooding and sample rotation Gui D, Xing ZX, Huang YH, Mo ZQ, Hua YN, Zhao SP, Cha LZ Applied Surface Science, 255(4), 1433, 2008 |
| 4 |
Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2+ technique Gui D, Mo ZQ, Xing ZX, Huang YH, Hua YN, Zhao SP, Cha LZ Applied Surface Science, 255(4), 1437, 2008 |
| 5 |
Improved boron activation with reduced preheating temperature during flash annealing of preamorphized silicon Poon CH, See A, Tan YL, Zhou MS, Gui D Journal of the Electrochemical Society, 155(2), H59, 2008 |
| 6 |
Effect of germanium preamorphization implant on boron deactivation in silicon following multiple-pulse flash annealing Poon CH, See A, Tan YL, Zhou M, Gui D Electrochemical and Solid State Letters, 10(12), H362, 2007 |
| 7 |
Application of molecular dynamics for low-energy ion implantation in crystalline silicon Chan HY, Srinivasan MP, Montgomery NJ, Mulcahy CPA, Biswas S, Gossmann HJL, Harris M, Nordlund K, Benistant F, Ng CM, Gui D, Chan L Journal of Vacuum Science & Technology B, 24(1), 462, 2006 |
| 8 |
Effect of plasma process on low-k material and barrier layer performance Chen XT, Gui D, Mo ZQ, Du AY, Chi DZ, Wang WD, Wang YH, Lu D, Tang LJ, Li WH, Wong LY Thin Solid Films, 504(1-2), 248, 2006 |
| 9 |
Modulation of capacitance magnitude by charging/discharging in silicon nanocrystals distributed throughout the gate oxide in MOS structures Ng CY, Chen TP, Liu Y, Tse MS, Gui D Electrochemical and Solid State Letters, 8(1), G8, 2005 |
| 10 |
SIMS study on N diffusion in hafnium oxynitride Gui D, Kang JF, Yu HY, Lim HF Applied Surface Science, 231-2, 590, 2004 |