화학공학소재연구정보센터
검색결과 : 18건
No. Article
1 Fabrication and characterization of Sb/B4C multilayer mirrors for soft X-rays
Kopylets IA, Kondratenko VV, Zubarev EN, Voronov DL, Gullikson EM, Vishnyakov EA, Ragozin EN
Applied Surface Science, 307, 360, 2014
2 Control of surface mobility for conformal deposition of Mo-Si multilayers on saw-tooth substrates
Voronov DL, Anderson EH, Gullikson EM, Salmassi F, Warwick T, Yashchuk VV, Padmore HA
Applied Surface Science, 284, 575, 2013
3 Chemical-State Analysis of Organic Semiconductors Using Soft X-ray Absorption Spectroscopy Combined with First-Principles Calculation
Natsume Y, Kohno T, Minakata T, Konishi T, Gullikson EM, Muramatsu Y
Journal of Physical Chemistry A, 116(6), 1527, 2012
4 Extreme ultraviolet mask substrate surface roughness effects on lithographic patterning
George SA, Naulleau PP, Mochi I, Salmassi F, Gullikson EM, Goldberg KA, Anderson EH
Journal of Vacuum Science & Technology B, 28(6), C6E23, 2010
5 Measuring the Structure of Epitaxially Assembled Block Copolymer Domains with Soft X-ray Diffraction
Stein GE, Liddle JA, Aquila AL, Gullikson EM
Macromolecules, 43(1), 433, 2010
6 Effects of mask absorber structures on the extreme ultraviolet lithography
Seo HS, Lee DG, Kim H, Huh S, Ahn BS, Han H, Kim D, Kim SS, Cho HK, Gullikson EM
Journal of Vacuum Science & Technology B, 26(6), 2208, 2008
7 Multilayer phase-only diffraction gratings: Fabrication and application to extreme ultraviolet optics
Salmassi F, Gullikson EM, Anderson EH, Naulleau PP
Journal of Vacuum Science & Technology B, 25(6), 2055, 2007
8 Extreme ultraviolet binary phase gratings: Fabrication and application to diffractive optics
Salmassi F, Naulleau PP, Gullikson EM, Olynick DL, Liddle JA
Journal of Vacuum Science & Technology A, 24(4), 1136, 2006
9 Lithographic characterization of the flare in the Berkeley 0.3 numerical aperture extreme ultraviolet microfield optic
Cain JP, Naulleau PP, Gullikson EM, Spanos CJ
Journal of Vacuum Science & Technology B, 24(3), 1234, 2006
10 Interface engineering of short-period Ni/V multilayer X-ray mirrors
Eriksson F, Ghafoor N, Schafers F, Gullikson EM, Birch J
Thin Solid Films, 500(1-2), 84, 2006