화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Analysis of screw feeding of faceted particles by discrete element method
Lopez A, Vivacqua V, Hammond R, Ghadiri M
Powder Technology, 367, 474, 2020
2 Call for transparency of COVI D-19 models
Barton CM, Alberti M, Ames D, Atkinson JA, Bales J, Burke E, Chen M, Diallo SY, Earn DJD, Fath B, Feng ZL, Gibbons C, Hammond R, Heffernan J, Houser H, Hovmand PS, Kopainsky B, Mabry PL, Mair C, Meier P, Niles R, Nosek B, Osgood N, Pierce S, Polhill JG, Prosser L, Robinson E, Rosenzweig C, Sankaran S, Stange K, Tucker G
Science, 368(6490), 482, 2020
3 DEM analysis of the effect of particle shape, cohesion and strain rate on powder rheometry
Vivacqua V, Lopez A, Hammond R, Ghadiri M
Powder Technology, 342, 653, 2019
4 Effect of fluid rheology on enhanced oil recovery in a microfluidic sandstone device
Nilsson MA, Kulkarni R, Gerberich L, Hammond R, Singh R, Baumhoff E, Rothstein JP
Journal of Non-Newtonian Fluid Mechanics, 202, 112, 2013
5 Nuclear targeting by fragmentation of the Potato spindle tuber viroid genome
Abraltiene A, Zhao Y, Hammond R
Biochemical and Biophysical Research Communications, 368(3), 470, 2008
6 Si/SiC heterojunctions fabricated by direct wafer bonding
Jennings MR, Perez-Tomas A, Guy OJ, Hammond R, Burrows SE, Gammon PM, Lodzinski M, Covington JA, Mawby PA
Electrochemical and Solid State Letters, 11(11), H306, 2008
7 Analysis of carrier generation lifetime in strained-Si/SiGe heterojunction MOSFETs from capacitance transient
Bera LK, Mathew S, Balasubramanian N, Braithwaite G, Currie MT, Singaporewala F, Yap J, Hammond R, Lochtefeld A, Bulsara MT, Fitzgerald EA
Applied Surface Science, 224(1-4), 278, 2004
8 Investigation of electrical properties of furnace grown gate oxide on strained-Si
Bera LK, Mathew S, Balasubramanian N, Leitz C, Braithwaite G, Singaporewala F, Yap J, Carlin J, Langdo I, Lochtefeld T, Currie M, Hammond R, Fiorenza J, Badawi H, Bulsara M
Thin Solid Films, 462-63, 85, 2004
9 Application of high-resolution capillary array electrophoresis with automated fraction collection for GeneCalling (TM) analysis of the yeast genomic DNA
Berka J, Ruiz-Martinez MC, Hammond R, Minarik M, Foret F, Sosic Z, Kleparnik K, Karger BL
Electrophoresis, 24(4), 639, 2003
10 High-temperature neutron diffraction of the AlN-Al2O3-Y2O3 system
Medraj M, Hammond R, Thompson WT, Drew RAL
Journal of the American Ceramic Society, 86(4), 717, 2003