검색결과 : 4건
No. | Article |
---|---|
1 |
Transmission electron microscopy and high-resolution electron microscopy studies of structural defects induced in Si single crystals implanted by helium ions at 600 degrees C Han WT, Liu HP, Li BS Applied Surface Science, 455, 433, 2018 |
2 |
Low-energy ion-beam induced effects in Al(100) surface studied using Rutherford backscattering and channeling Ramana CV, Choi BS, Smith RJ Applied Surface Science, 214(1-4), 338, 2003 |
3 |
High frequency n-type MODFETs on ultra-thin virtual SiGe substrates Hackbarth T, Herzog HJ, Rinaldi F, Soares T, Hollander B, Mantl S, Luysberg M, Fichtner PFP Solid-State Electronics, 47(7), 1179, 2003 |
4 |
Polytype-dependent vacancy annealing studied by positron annihilation Kawasuso A, Yoshikawa M, Maekawa M, Itoh H, Chiba T, Redmann F, Krause-Rehberg R, Weidner M, Frank T, Pensl G Materials Science Forum, 433-4, 477, 2002 |