검색결과 : 3건
No. | Article |
---|---|
1 |
The role of carrier lifetime in forward bias degradation of 4H-SiC PiN diodes Hefner A, McNutt T, Berning D, Singh R, Akuffo A Materials Science Forum, 457-460, 1053, 2004 |
2 |
Compact models for silicon carbide power devices McNutt T, Hefner A, Mantooth A, Berning D, Singh R Solid-State Electronics, 48(10-11), 1757, 2004 |
3 |
MEMS-based embedded sensor virtual components for system-on-a-chip (SoC) Afridi M, Hefner A, Berning D, Ellenwood C, Varma A, Jacob B, Semancik S Solid-State Electronics, 48(10-11), 1777, 2004 |