화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Deposition of silicon alloys in an integrated distributed electron cyclotron resonance reactor: Oxide, nitride, oxinitrides, and multilayer structures
Bulkin P, Hofrichter A, Heitz T, Huc J, Drevillon B, Benattar JJ
Journal of Vacuum Science & Technology A, 20(2), 338, 2002
2 Ellipsometric method for real time control of thin film deposition on imperfect substrates
Hofrichter A, Heitz T, Bulkin P, Drevillon B
Journal of Vacuum Science & Technology A, 20(3), 702, 2002
3 Photoluminescence intensity and anisotropy decays in amorphous carbon
Berberan-Santos M, Fedorov A, Conde JP, Godet C, Heitz T, Bouree JE
Chemical Physics Letters, 319(1-2), 113, 2000
4 Real time control of plasma deposited optical filters by multiwavelength ellipsometry
Heitz T, Hofrichter A, Bulkin P, Drevillon B
Journal of Vacuum Science & Technology A, 18(4), 1303, 2000
5 In situ infrared ellipsometry study of the growth of hydrogenated amorphous carbon thin films
Heitz T, Drevillon B
Thin Solid Films, 313-314, 704, 1998
6 PREPARATION AND DETERMINATION OF THE STRUCTURE OF HIGHPERFORMANCE POLYMER BLENDS BY SMALL-ANGLE NEUTRON-SCATTERING
CASPAR J, DUNGES B, KIRSTE RG, HEITZ T, WIEDENMANN A
Macromolecular Rapid Communications, 16(10), 771, 1995