검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Effect of surface iron on photoconductivity carrier recombination lifetime of p-type silicon Park HS, Helms CR, Ko DH Journal of the Electrochemical Society, 145(5), 1724, 1998 |
| 2 |
Influence of Interface Roughness on Silicon-Oxide Thickness Measured by Ellipsometry Fang SJ, Chen W, Yamanaka T, Helms CR Journal of the Electrochemical Society, 144(8), L231, 1997 |
| 3 |
The Evolution of (001)Si/SiO2 Interface Roughness During Thermal-Oxidation Fang SJ, Chen W, Yamanaka T, Helms CR Journal of the Electrochemical Society, 144(8), 2886, 1997 |
| 4 |
Analysis of Interface Roughnesss Effect on Metal-Oxide-Semiconductor Fowler-Nordheim Tunneling Behavior Using Atomic-Force Microscope Images Lin HC, Ying JF, Yamanaka T, Fang SJ, Helms CR Journal of Vacuum Science & Technology A, 15(3), 790, 1997 |
| 5 |
Thermodynamic Model Prediction of Metal Removal During Hydrogen Annealing of Si Wafers Helms CR Journal of the Electrochemical Society, 142(8), L125, 1995 |
| 6 |
Wet Chemical Cleaning and Surface-Analysis of ZnSe Melendez JL, Helms CR Journal of the Electrochemical Society, 141(7), 1973, 1994 |