검색결과 : 17건
| No. | Article |
|---|---|
| 1 |
Estimating depolarization with the Jones matrix quality factor Hilfiker JN, Hale JS, Herzinger CM, Tiwald T, Hong N, Schoche S, Arwin H Applied Surface Science, 421, 494, 2017 |
| 2 |
Spectroscopic ellipsometry characterization of coatings on biaxially anisotropic polymeric substrates Hilfiker JN, Pietz B, Dodge B, Sun JN, Hong NN, Schoeche S Applied Surface Science, 421, 500, 2017 |
| 3 |
Determining thickness and refractive index from free-standing ultrathin polymer films with spectroscopic ellipsometry Hilfiker JN, Stadermann M, Sun JN, Tiwald T, Hale JS, Miller PE, Aracne-Ruddle C Applied Surface Science, 421, 508, 2017 |
| 4 |
Mueller matrix characterization of flexible plastic substrates Hong NN, Synowicki RA, Hilfiker JN Applied Surface Science, 421, 518, 2017 |
| 5 |
Multiple oscillator models for the optical constants of polycrystalline zinc oxide thin films over a wide wavelength range Khoshman JM, Hilfiker JN, Tabet N, Kordesch ME Applied Surface Science, 307, 558, 2014 |
| 6 |
Extension of Far UV spectroscopic ellipsometry studies of High-kappa dielectric films to 130 nm Kamineni VK, Hilfiker JN, Freeouf JL, Consiglio S, Clark R, Leusink GJ, Diebold AC Thin Solid Films, 519(9), 2894, 2011 |
| 7 |
Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry Hilfiker JN, Singh N, Tiwald T, Convey D, Smith SM, Baker JH, Tompkins HG Thin Solid Films, 516(22), 7979, 2008 |
| 8 |
Electronic and optical properties of Ta1-xZrxN films: Experimental and ab initio studies Aouadi SM, Bohnhoff A, Amriou T, Haasch RT, Williams M, Hilfiker JN Journal of Vacuum Science & Technology A, 23(4), 705, 2005 |
| 9 |
Mueller-matrix characterization of liquid crystals Hilfiker JN, Herzinger CM, Wagner T, Marino A, Delgais G, Abbate G Thin Solid Films, 455-56, 591, 2004 |
| 10 |
Generalized spectroscopic ellipsometry and Mueller-matrix study of twisted nematic and super twisted nematic liquid crystals Hilfiker JN, Johs B, Herzinger CM, Elman JF, Montbach E, Bryant D, Bos PJ Thin Solid Films, 455-56, 596, 2004 |