검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Analysis of defects in epitaxial oxide thin films via X-ray diffraction technology Hollmann E, Wordenweber R Thin Solid Films, 515(7-8), 3530, 2007 |
| 2 |
Aluminium nitride-niobium multilayers and free-standing structures for MEMS Danylyuk SV, Ott R, Panaitov G, Pickartz G, Hollmann E, Vitusevich SA, Belyaev AE, Klein N Thin Solid Films, 515(2), 489, 2006 |