화학공학소재연구정보센터
검색결과 : 20건
No. Article
1 Three-dimensional integration of nanotechnologies for computing and data storage on a single chip
Shulaker MM, Hills G, Park RS, Howe RT, Saraswat K, Wong HSP, Mitra S
Nature, 547(7661), 74, 2017
2 Photon-enhanced thermionic emission for solar concentrator systems
Schwede JW, Bargatin I, Riley DC, Hardin BE, Rosenthal SJ, Sun Y, Schmitt F, Pianetta P, Howe RT, Shen ZX, Melosh NA
Nature Materials, 9(9), 762, 2010
3 Experimental Investigation of Silicon Surface Migration in Low Pressure Nonreducing Gas Environments
Kant R, Ferralis N, Provine J, Maboudian R, Howe RT
Electrochemical and Solid State Letters, 12(12), H437, 2009
4 Electrical and Mechanical Characterization of Doped and Annealed Polycrystalline 3C-SiC Thin Films
Roper CS, Radmilovic V, Howe RT, Maboudian R
Journal of the Electrochemical Society, 156(1), D5, 2009
5 Room-Temperature Wet Etching of Polycrystalline and Nanocrystalline Silicon Carbide Thin Films with HF and HNO3
Roper CS, Howe RT, Maboudian R
Journal of the Electrochemical Society, 156(3), D104, 2009
6 Laser print patterning of planar spiral inductors and interdigitated capacitors
Klejwa N, Misra R, Provine J, Howe RT, Klejwa SJ
Journal of Vacuum Science & Technology B, 27(6), 2745, 2009
7 Effects of annealing on residual stress and strain gradient of doped polycrystalline SiC thin films
Roper CS, Radmilovic V, Howe RT, Maboudian R
Electrochemical and Solid State Letters, 11(4), D35, 2008
8 Electrical characterization of n-type polycrystalline 3C-silicon carbide thin films deposited by 1,3-disilabutane
Zhang JC, Howe RT, Maboudiana R
Journal of the Electrochemical Society, 153(6), G548, 2006
9 Single-source chemical vapor deposition of SiC films in a large-scale low-pressure CVD growth, chemical, and mechanical characterization reactor
Roper CS, Radmilovic V, Howe RT, Maboudian R
Journal of the Electrochemical Society, 153(8), C562, 2006
10 Selective growth of Si nanowire arrays via galvanic displacement processes in water-in-oil microemulsions
Gao D, He RR, Carraro C, Howe RT, Yang PD, Maboudian R
Journal of the American Chemical Society, 127(13), 4574, 2005