검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Electrical characterization of silicon-on-insulator structures with a nondamaging elastic-metal gate Hillard RJ, Howland WH, Tan LC, Ye W Journal of Vacuum Science & Technology B, 22(1), 450, 2004 |
| 2 |
Product wafer monitoring of ultrashallow channel implants with an elastic metal gate Hillard RJ, Howland WH, Mazur RG, Ye W, Variam NK Journal of Vacuum Science & Technology B, 20(1), 488, 2002 |
| 3 |
On Semiconductor Surface Evaluation Using the Effective Surface Recombination Speed for Schottky-Coupled Photovoltage Measurements Howland WH, Fonash SJ Journal of the Electrochemical Society, 143(6), 1958, 1996 |
| 4 |
Errors and Error-Avoidance in the Schottky Coupled Surface Photovoltage Technique Howland WH, Fonash SJ Journal of the Electrochemical Society, 142(12), 4262, 1995 |