검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Interfacial diffusion studies of Cu/(5 nm Ru)/Si structures - Physical vapor deposited vs electrochemically deposited Cu Arunagiri TN, Zhang YB, Chyan O, Kim MJ, Hurd TQ Journal of the Electrochemical Society, 152(11), G808, 2005 |
| 2 |
Diffusion studies of copper on ruthenium thin film - A plateable copper diffusion barrier Chan R, Arunagiri TN, Zhang Y, Chyan O, Wallace RM, Kim MJ, Hurd TQ Electrochemical and Solid State Letters, 7(8), G154, 2004 |
| 3 |
Impact of Fe and Cu Contamination on the Minority-Carrier Lifetime of Silicon Substrates Rotondaro AL, Hurd TQ, Kaniava A, Vanhellemont J, Simoen E, Heyns MM, Claeys C Journal of the Electrochemical Society, 143(9), 3014, 1996 |