검색결과 : 2건
No. | Article |
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1 |
Simple Equipment Tolerant Reflectometry for Monitoring of Molecular-Beam Epitaxy and Metalorganic Chemical-Vapor-Deposition Growth Bean JC, Peticolas LJ, Lum R, Mcdonald ML Journal of Vacuum Science & Technology A, 14(3), 946, 1996 |
2 |
Characterization of Substrate-Temperature and Damage in Diamond Growth Plasmas by Multichannel Spectroellipsometry Wakagi M, Hong BG, Nguyen HV, Collins RW, Drawl W, Messier R Journal of Vacuum Science & Technology A, 13(4), 1917, 1995 |