검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Extended X-Ray-Absorption Fine-Structure (EXAFS) Study of Secondary Phases in Yb2O3-Doped Si3N4 Ceramics Kizler P, Kleebe HJ, Aldinger F, Ruhle M Journal of Materials Science, 32(2), 369, 1997 |
| 2 |
Silicon-Nitride Crystal-Structure and Observations of Lattice-Defects Wang CM, Pan XQ, Ruhle M, Riley FL, Mitomo M Journal of Materials Science, 31(20), 5281, 1996 |
| 3 |
Transmission Electron-Microscopy Characterization of a Fluorine-Doped Si3N4 Kleebe HJ, Pezzotti G, Nishida T Journal of Materials Science Letters, 14(23), 1668, 1995 |