검색결과 : 22건
| No. | Article |
|---|---|
| 1 |
Curvature radius measurement by optical profiler and determination of the residual stress in thin films Besnard A, Ardigo MR, Imhoff L, Jacquet P Applied Surface Science, 487, 356, 2019 |
| 2 |
Nanostructured Pt-TiO2 composite thin films obtained by direct liquid injection metal organic chemical vapor deposition: Control of chemical state by X-ray photoelectron spectroscopy Avril L, Bourgeois S, Simon P, Domenichini B, Zanfoni N, Herbst F, Imhoff L Thin Solid Films, 591, 237, 2015 |
| 3 |
TiO2 anatase films obtained by direct liquid injection atomic layer deposition at low temperature Avril L, Reymond-Laruinaz S, Decams JM, Bruyere S, Potin V, de Lucas MCM, Imhoff L Applied Surface Science, 288, 201, 2014 |
| 4 |
Flash annealing influence on structural and electrical properties of TiO2/TiO/Ti periodic multilayers Cacucci A, Heintz O, Tsiaoussis I, Avril L, Potin V, Imhoff L, Martin N Thin Solid Films, 553, 47, 2014 |
| 5 |
Structural and electrical properties in tungsten/tungsten oxide multilayers Cacucci A, Potin V, Imhoff L, Martin N Thin Solid Films, 553, 93, 2014 |
| 6 |
Structural analysis of W3O/WO3 and TiO/TiO2 periodic multilayer thin films sputter deposited by the reactive gas pulsing process Cacucci A, Potin V, Imhoff L, de Lucas MCM, Martin N Thin Solid Films, 520(14), 4778, 2012 |
| 7 |
Structure and chemical bonds in reactively sputtered black Ti-C-N-O thin films Chappe JM, de Lucas MCM, Cunha L, Moura C, Pierson JF, Imhoff L, Heintz O, Potin V, Bourgeois S, Vaz F Thin Solid Films, 520(1), 144, 2011 |
| 8 |
Structural and electrical properties of magnetron sputtered Ti(ON) thin films: The case of TiN doped in situ with oxygen Trenczek-Zajac A, Radecka M, Zakrzewska K, Brudnik A, Kusior E, Bourgeois S, de Lucas MCM, Imhoff L Journal of Power Sources, 194(1), 93, 2009 |
| 9 |
Pulsed laser growth and characterization of thin films on titanium substrates Lavisse L, Jouvard JM, Imhoff L, Heintz O, Korntheuer J, Langlade C, Bourgeois S, de Lucas MCM Applied Surface Science, 253(19), 8226, 2007 |
| 10 |
Angle resolved X-ray photoemission spectroscopy double layer model for in situ characterization of metal organic chemical vapour deposition nanometric films Brevet A, Imhoff L, de Lucas MCM, Domenichini B, Bourgeois S Thin Solid Films, 515(16), 6407, 2007 |