1 |
Damage to amorphous indium-gallium-zinc-oxide thin film transistors under Cl2 and BCl3 plasma Choi JH, Kim SJ, Kim HT, Cho SM Korean Journal of Chemical Engineering, 35(6), 1348, 2018 |
2 |
Analytical approximation of the InGaZnO thin-film transistors surface potential Colalongo L Solid-State Electronics, 124, 1, 2016 |
3 |
Investigation of temperature-dependent asymmetric degradation behavior induced by hot carrier effect in oxygen ambiance in In-Ga-Zn-O thin film transistors Chen BW, Chang TC, Hung YJ, Hsieh TY, Tsai MY, Liao PY, Tsai WW, Chiang WJ, Yan JY Thin Solid Films, 572, 33, 2014 |
4 |
Temperature and gate bias dependence of carrier transport mechanisms in amorphous indium-gallium-zinc oxide thin film transistors Huang XM, Wu CF, Lu H, Ren FF, Chen DJ, Jiang R, Zhang R, Zheng YD, Xu QY Solid-State Electronics, 86, 41, 2013 |
5 |
Investigating degradation behavior of InGaZnO thin-film transistors induced by charge-trapping effect under DC and AC gate bias stress Hsieh TY, Chang TC, Chen TC, Tsai MY, Chen YT Thin Solid Films, 528, 53, 2013 |
6 |
Investigating the degradation behavior under hot carrier stress for InGaZnO TFTs with symmetric and asymmetric structures Tsai MY, Chang TC, Chu AK, Chen TC, Hsieh TY, Chen YT, Tsai WW, Chiang WJ, Yan JY Thin Solid Films, 528, 57, 2013 |
7 |
Device characteristics of amorphous indium gallium zinc oxide thin film transistors with ammonia incorporation Huang SY, Chang TC, Chen MC, Tsao SW, Chen SC, Tsai CT, Lo HP Solid-State Electronics, 61(1), 96, 2011 |
8 |
Effect of N(2)O plasma treatment on the improvement of instability under light illumination for InGaZnO thin-film transistors Hsieh TY, Chang TC, Chen TC, Tsai MY, Lu WH, Chen SC, Jian FY, Lin CS Thin Solid Films, 520(5), 1427, 2011 |
9 |
Paraffin wax passivation layer improvements in electrical characteristics of bottom gate amorphous indium-gallium-zinc oxide thin-film transistors Chang GW, Chang TC, Syu YE, Tsai TM, Chang KC, Tu CH, Jian FY, Hung YC, Tai YH Thin Solid Films, 520(5), 1608, 2011 |
10 |
Fabrication of Indium Gallium Zinc Oxide (IGZO) TFTs Using a Solution-Based Process Park MS, Lee DH, Bae EJ, Kim DH, Kang JG, Son DH, Ryu SO Molecular Crystals and Liquid Crystals, 529, 137, 2010 |