화학공학소재연구정보센터
검색결과 : 21건
No. Article
1 Evaluation of the effective work-function of monolayer graphene on silicon dioxide by internal photoemission spectroscopy
Trepalin V, Asselberghs I, Brems S, Huyghebaert C, Radu I, Afanas'ev V, Houssa M, Stesmans A
Thin Solid Films, 674, 39, 2019
2 Mapping the interfacial reaction of alpha-Ga2O3 Schottky contacts through scanning internal photoemission microscopy
Shiojima K, Kambara H, Matsuda T, Shinohe T
Thin Solid Films, 685, 17, 2019
3 Investigation of ultrathin Pt/ZrO2-Al2O3-ZrO2/TiN DRAM capacitors Schottky barrier height by internal photoemission spectroscopy
Lee SY, Chang J, Choi J, Kim Y, Lim H, Jeon H, Seo H
Current Applied Physics, 17(2), 267, 2017
4 내부 광전자방출 분광법을 이용한 Pt/HfO2/p-Si Metal-Insulator-Semiconductor 커패시터의 쇼트키 배리어 분석
이상연, 서형탁
Korean Journal of Materials Research, 27(1), 48, 2017
5 Electron barrier height at CuxTe1-x/Al2O3 interfaces of conducting bridge memory stacks
Afanas'ev VV, De Stefano F, Houssa M, Stesmans A, Goux L, Opsomer K, Detavernier C, Kittl JA, Jurczak M
Thin Solid Films, 533, 34, 2013
6 Effect of oxygen on tuning the TiNx metal gate work function on LaLuO3
Mitrovic IZ, Przewlocki HM, Piskorski K, Simutis G, Dhanak VR, Sedghi N, Hall S
Thin Solid Films, 520(23), 6959, 2012
7 Band alignment of metal-oxide-semiconductor structure by internal photoemission spectroscopy and spectroscopic ellipsometry
Nguyen NV, Kirillov OA, Suehle JS
Thin Solid Films, 519(9), 2811, 2011
8 Characterization of heterojunctions in crystalline-silicon-based solar cells by internal photoemission
Sakata I, Yamanaka M, Kawanami H
Solar Energy Materials and Solar Cells, 93(6-7), 737, 2009
9 Internal photoemission spectroscopy measurement of Alq(3)/cathode interface by three layered electron only device
Itoh E, Takaishi S, Miyairi K
Thin Solid Films, 518(2), 791, 2009
10 Internal photoemission study on charge trapping behavior in rapid thermal oxides on strained-Si/SiGe heterolayers
Bera MK, Mahata C, Bhattacharya S, Chakraborty AK, Armstrong BM, Gamble HS, Maiti CK
Applied Surface Science, 255(5), 2971, 2008