검색결과 : 1건
No. | Article |
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1 |
Critical distance for secondary ion formation: Experimental SIMS measurements Kudriavtsev Y, Gallardo S, Villegas A, Ramirez G, Asomoza R Applied Surface Science, 255(4), 877, 2008 |
No. | Article |
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1 |
Critical distance for secondary ion formation: Experimental SIMS measurements Kudriavtsev Y, Gallardo S, Villegas A, Ramirez G, Asomoza R Applied Surface Science, 255(4), 877, 2008 |