| 1 |
Bubble distribution in fused quartz crucibles studied by micro X-Ray computational tomography. Comparing 2D and 3D analysis
Paulsen O, Rorvik S, Muggerud AMF, Juel M
Journal of Crystal Growth, 520, 96, 2019 |
| 2 |
Influence of grown-in defects on final oxygen precipitates during heat treatment of Cz-Si wafer analyzed by a coupled model with the interaction of point defects, oxygen precipitates, and dislocation loops
Gao B, Juel M, Mhamdi M
Journal of Crystal Growth, 453, 173, 2016 |
| 3 |
Identification of defects causing performance degradation of high temperature n-type Czochralski silicon bifacial solar cells
Gaspar G, Coletti G, Juel M, Wurzner S, Sondena R, Di Sabatino M, Arnberg L, Ovrelid EJ
Solar Energy Materials and Solar Cells, 153, 31, 2016 |
| 4 |
Investigating the effect of carbon on oxygen behavior in n-type Czochralski silicon for PV application
Zhang S, Juel M, Ovrelid EJ, Tranell G
Journal of Crystal Growth, 411, 63, 2015 |
| 5 |
On the shape of n-type Czochralski silicon top ingots
Gaspar G, Juel M, Sonden R, Pascoa S, Di Sabatino M, Arnberg L, Ovrelid EJ
Journal of Crystal Growth, 418, 176, 2015 |
| 6 |
Study of evolution of dislocation clusters in high performance multicrystalline silicon
Stokkan G, Hu Y, Mjos O, Juel M
Solar Energy Materials and Solar Cells, 130, 679, 2014 |
| 7 |
Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection
Sondena R, Hu Y, Juel M, Wiig MS, Angelskar H
Journal of Crystal Growth, 367, 68, 2013 |
| 8 |
Oxidation of thin Ce layers on Rh(110)
Juel M, Martinsen S, Raaen S
Thin Solid Films, 517(2), 805, 2008 |
| 9 |
Temperature programed desorption of C2H4 from pure and graphite-covered Pt(111)
Vermang B, Juel M, Raaen S
Journal of Vacuum Science & Technology A, 25(6), 1512, 2007 |
