검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Improved characterization methods for unipolar directly bonded semiconductor junctions Stuchinsky VA, Kamaev GN, Khoroshilov KY Solid-State Electronics, 49(1), 9, 2005 |
| 2 |
A study of interface states of directly bonded silicon-on-insulator structures Buldygin SA, Golod SV, Kamaev GN, Skok EM Journal of Crystal Growth, 210(1-3), 107, 2000 |
| 3 |
Application of the narrow spectral range InAs-FPA-based IR camera for the investigation of the interface voids in silicon wafer bonding Vainer BG, Kamaev GN, Kurishev GL Journal of Crystal Growth, 210(1-3), 351, 2000 |