화학공학소재연구정보센터
검색결과 : 13건
No. Article
1 Tunability, ferroelectric and leakage studies on pulsed laser ablated (Pb0.92La0.08)(Zr0.60Ti0.40)O-3 thin films
James AR, Kumar A, Prasad VVB, Kamat SV, Singh V, Ghoshal P, Pandey A
Materials Chemistry and Physics, 211, 295, 2018
2 Magnetic behaviour of as-deposited and rapid thermal annealed Pr-Fe thin films
Balakrishna M, Chelvane JA, Basumatary H, Palit M, Rao DS, Kamat SV
Thin Solid Films, 629, 6, 2017
3 Effect of grain size on microstructure and magnetic properties of Sm-2(Co,Cu,Fe,Zr)(17) permanent magnets
Palit M, Rajkumar DM, Pandian S, Kamat SV
Materials Chemistry and Physics, 179, 214, 2016
4 Density functional study of half-metallic property on B2 disordered Co2FeSi
Mohankumar R, Ramasubramanian S, Rajagopalan M, Raja MM, Kamat SV, Kumar J
Journal of Materials Science, 50(3), 1287, 2015
5 Effect of sputtering pressure and power on composition, surface roughness, microstructure and magnetic properties of as-deposited Co2FeSi thin films
Srinivas K, Raja MM, Rao DVS, Kamat SV
Thin Solid Films, 558, 349, 2014
6 Modification of the properties of polythiophene thin films by vapor chopping
Kamat SV, Yadav JB, Puri V, Puri RK
Applied Surface Science, 258(19), 7567, 2012
7 Optimization of sputtering parameters for Sm-Co thin films using design of experiments
Ramana GV, Saravanan P, Kamat SV, Aparna Y
Applied Surface Science, 261, 110, 2012
8 Room temperature synthesis and characterization of polythiophene thin films by chemical bath deposition (CBD) method
Kamat SV, Puri V, Puri RK
Materials Chemistry and Physics, 132(1), 228, 2012
9 Characterization of poly (3-methyl thiophene) thin films prepared by modified chemical bath deposition
Kamat SV, Yadav JB, Puri V, Puri RK, Joo OS
Applied Surface Science, 258(1), 482, 2011
10 Key microstructural features responsible for improved stress corrosion cracking resistance and weldability in 7xxx series al alloys containing micro/trace alloying additions
Mukhopadhyay AK, Prasad KS, Kumar V, Reddy GM, Kamat SV, Varma VK
Materials Science Forum, 519-521, 315, 2006