검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Revealing the microstructural stability of a three-phase soft solid (ice cream) by 4D synchrotron X-ray tomography Guo EY, Kazantsev D, Mo JY, Bent J, Van Dalen G, Schuetz P, Rockett P, StJohn D, Lee PD Journal of Food Engineering, 237, 204, 2018 |
| 2 |
Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques Ber B, Babor P, Brunkov PN, Chapon P, Drozdov MN, Duda R, Kazantsev D, Polkovnikov VN, Yunin P, Tolstogouzov A Thin Solid Films, 540, 96, 2013 |
| 3 |
Simultaneous IR material recognition and conductivity mapping by nanoscale near-field microscopy Huber AJ, Kazantsev D, Keilmann F, Wittborn J, Hillenbrand R Advanced Materials, 19(17), 2209, 2007 |