| 1 |
Contact potential and scanning Kelvin force microscopy measurements on sulphate-anion intercalated graphite
Yivlialin R, Pace G, Bussetti G, Caironi M, Duo L
Electrochimica Acta, 267, 20, 2018 |
| 2 |
Time-resolved opto-electronic properties of poly(3-hexylthiophene-2,5-diyl) Fullerene heterostructures detected by Kelvin force microscopy
Cermak J, Rezek B, Cimrova V, Fejfar A, Purkrt A, Vanecek M, Kocka J
Thin Solid Films, 519(2), 836, 2010 |
| 3 |
Zn1-xMgxO/ZnO heterostructures studied by Kelvin probe force microscopy conjunction with probe characterizer
Chiu TW, Itoh H, Tampo H, Niki S
Applied Surface Science, 256(4), 1180, 2009 |
| 4 |
Fabrication of lateral lattice-polarity-inverted GaN heterostructure
Katayama R, Kuge Y, Kondo T, Onabe K
Journal of Crystal Growth, 301, 447, 2007 |
| 5 |
Ferroelectric properties of nano-size PZT grains determined by surface potential utilizing Kelvin force microscopy
Choi S, Heo J, Kim D, Chung IS
Thin Solid Films, 464-65, 277, 2004 |
| 6 |
Force-distance studies with piezoelectric tuning forks below 4.2 K
Rychen J, Ihn T, Studerus P, Herrmann A, Ensslin K, Hug HJ, van Schendel PJA, Guntherodt HJ
Applied Surface Science, 157(4), 290, 2000 |
