검색결과 : 6건
No. | Article |
---|---|
1 |
Overlayer stress effects on defect formation in Si and Ge Cowern NEB, Bennett NS, Ahn C, Yoon JC, Hamm S, Lerch W, Kheyrandish H, Cristiano F, Pakfar A Thin Solid Films, 518(9), 2442, 2010 |
2 |
Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of resistive Si1-xGex alloy layers Dowsett MG, Morris R, Chou PF, Corcoran SF, Kheyrandish H, Cooke GA, Maul JL, Patel SB Applied Surface Science, 203, 500, 2003 |
3 |
Thin sputtered platinum films on porous membranes as working electrodes in gas sensors Simmonds MC, Hitchman ML, Kheyrandish H, Colligon JS, Cade NJ, Iredale PJ Electrochimica Acta, 43(21-22), 3285, 1998 |
4 |
Ion-Beam-Assisted Deposition of Si-Carbide Films He ZG, Inoue S, Carter G, Kheyrandish H, Colligon JS Thin Solid Films, 260(1), 32, 1995 |
5 |
Effect of Deposition Parameters on the Microstructure of Ion-Beam-Assisted Deposition Tin Films Kheyrandish H, Colligon JS, Kim JK Journal of Vacuum Science & Technology A, 12(5), 2723, 1994 |
6 |
Influence of Charge-Exchange on Ion-Neutral Arrival Rates in an Ion-Assisted Deposition System Kim JK, Kheyrandish H, Colligon JS Journal of Vacuum Science & Technology A, 12(5), 2733, 1994 |