화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Overlayer stress effects on defect formation in Si and Ge
Cowern NEB, Bennett NS, Ahn C, Yoon JC, Hamm S, Lerch W, Kheyrandish H, Cristiano F, Pakfar A
Thin Solid Films, 518(9), 2442, 2010
2 Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of resistive Si1-xGex alloy layers
Dowsett MG, Morris R, Chou PF, Corcoran SF, Kheyrandish H, Cooke GA, Maul JL, Patel SB
Applied Surface Science, 203, 500, 2003
3 Thin sputtered platinum films on porous membranes as working electrodes in gas sensors
Simmonds MC, Hitchman ML, Kheyrandish H, Colligon JS, Cade NJ, Iredale PJ
Electrochimica Acta, 43(21-22), 3285, 1998
4 Ion-Beam-Assisted Deposition of Si-Carbide Films
He ZG, Inoue S, Carter G, Kheyrandish H, Colligon JS
Thin Solid Films, 260(1), 32, 1995
5 Effect of Deposition Parameters on the Microstructure of Ion-Beam-Assisted Deposition Tin Films
Kheyrandish H, Colligon JS, Kim JK
Journal of Vacuum Science & Technology A, 12(5), 2723, 1994
6 Influence of Charge-Exchange on Ion-Neutral Arrival Rates in an Ion-Assisted Deposition System
Kim JK, Kheyrandish H, Colligon JS
Journal of Vacuum Science & Technology A, 12(5), 2733, 1994