화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 Megahertz silicon atomic force microscopy (AFM) cantilever and high-speed readout in AFM-based recording
Hosaka S, Etoh K, Kikukawa A, Koyanagi H
Journal of Vacuum Science & Technology B, 18(1), 94, 2000
2 Force Modulation Atomic-Force Microscopy Recording for Ultrahigh Density Recording
Hosaka S, Koyanagi H, Kikukawa A, Miyamoto M, Nakamura K, Etoh K
Journal of Vacuum Science & Technology B, 15(4), 788, 1997
3 Fabrication of Nanometer-Scale Structures on Insulators and in Magnetic-Materials Using a Scanning Probe Microscope
Hosaka S, Koyanagi H, Kikukawa A, Miyamoto M, Imura R, Ushiyama J
Journal of Vacuum Science & Technology B, 13(3), 1307, 1995
4 Formation of Nanometer-Sized Au Dots on Si Substrate in Air
Hosaka S, Koyanagi H, Kikukawa A, Maruyama Y, Imura R
Journal of Vacuum Science & Technology B, 12(3), 1872, 1994