화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology
Morin P, Maitrejean S, Allibert F, Augendre E, Liu Q, Loubet N, Grenouillet L, Pofelski A, Chen KG, Khakifirooz A, Wacquez R, Reboh S, Bonnevialle A, le Royer C, Morand Y, Kanyandekwe J, Chanemougamme D, Mignot Y, Escarabajal Y, Lherron B, Chafik F, Pilorget S, Caubet P, Vinet M, Clement L, Desalvo B, Doris B, Kleemeier W
Solid-State Electronics, 117, 100, 2016
2 Ultra-low resistivity in-situ phosphorus doped Si and SiC epitaxy for source/drain formation in advanced 20 nm n-type field effect transistor devices
Loubet N, Adam T, Raymond M, Liu Q, Cheng KG, Sreenivasan R, Reznicek A, Khare P, Kleemeier W, Paruchuri V, Doris B, Sampson R
Thin Solid Films, 520(8), 3149, 2012
3 Thin-Film Induced Stress in GaAs Ridge-Wave-Guide Structures Integrated with Sputter-Deposited ZnO Films
Kim HK, Kleemeier W, Li YB, Langer DW, Cassidy DT, Bruce DM
Journal of Vacuum Science & Technology B, 12(3), 1328, 1994