화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Particle concentration measurements in process liquids using light-scattering techniques
Knotter DM, Wolters SAM, Kasanrokijat MA
Particulate Science and Technology, 25(5), 435, 2007
2 Etching mechanism of silicon nitride in HF-based solutions
Knotter DM, Denteneer TJJ
Journal of the Electrochemical Society, 148(3), F43, 2001
3 Etching mechanism of vitreous silicon dioxide in HF-based solutions
Knotter DM
Journal of the American Chemical Society, 122(18), 4345, 2000
4 Silicon surface roughening mechanisms in ammonia hydrogen peroxide mixtures
Knotter DM, de Gendt S, Mertens PW, Heyns MM
Journal of the Electrochemical Society, 147(2), 736, 2000
5 Hydrogen peroxide decomposition in ammonia solutions
Knotter DM, de Gendt S, Baeyens M, Mertens PW, Heyns HM
Journal of the Electrochemical Society, 146(9), 3476, 1999
6 Impact of iron contamination and roughness generated in ammonia hydrogen peroxide mixtures (SC1) on 5 nm gate oxides
De Gendt S, Knotter DM, Kenis K, Mertens PW, Heyns MM
Journal of the Electrochemical Society, 145(7), 2589, 1998