화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Preface
Ozyuzer L, Kosiel K, Reno JL, Basa DK
Thin Solid Films, 636, 745, 2017
2 Temperature-dependent electrical characterization of high-voltage AlGaN/GaN-on-Si HEMTs with Schottky and ohmic drain contacts
Taube A, Kaczmarski J, Kruszka R, Grochowski J, Kosiel K, Golaszewska-Malec K, Sochacki M, Jung W, Kaminska E, Piotrowska A
Solid-State Electronics, 111, 12, 2015
3 High-resolution X-ray characterization of mid-IR Al0.45Ga0.55As/GaAs Quantum Cascade Laser structures
Kubacka-Traczyk J, Sankowska I, Seeck OH, Kosiel K, Bugajski M
Thin Solid Films, 564, 339, 2014
4 Fine oscillatory structure of the current passing through resonant-tunneling diodes
Pelya O, Figielski T, Kosiel K, Wosinski T, Makosa A, Dobrowolski W, Dobrzanski L
Materials Science Forum, 384-3, 27, 2002
5 Influence of covering on critical thickness of strained InxGa1-xAs layer
Jasik A, Kosiel K, Strupinski W, Wesolowski M
Thin Solid Films, 412(1-2), 50, 2002
6 MOVPE strain layers - growth and application
Strupinski W, Dillner L, Sass J, Kosiel K, Stake J, Ingvarson M, Jakiela R
Journal of Crystal Growth, 221, 20, 2000