검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Electromigration-induced morphology of 70 nm Al-Cu and Al lines Pang X, Kriman AM, Bernstein GH Journal of the Electrochemical Society, 150(4), G258, 2003 |
| 2 |
Electromigration in nanometer Al-Cu interconnect lines Pang X, Kriman AM, Bernstein GH Journal of the Electrochemical Society, 149(2), G103, 2002 |