검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Polarized Raman spectroscopy analysis of SiHX bonds in nanocrystalline silicon thin films Chaigneau M, Johnson EV, Kroely L, Cabarrocas PRI, Ossikovski R Thin Solid Films, 537, 145, 2013 |
| 2 |
Raman scattering analysis of SiH bond stretching modes in hydrogenated microcrystalline silicon for use in thin-film photovoltaics Johnson EV, Kroely L, Cabarrocas PRI Solar Energy Materials and Solar Cells, 93(10), 1904, 2009 |