검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
The search for cathode and anode traps in high-voltage stressed silicon oxides Chen L, Kang CS, Oralkan O, Dumin DJ, Brown GA, Bellutti P Journal of the Electrochemical Society, 145(4), 1292, 1998 |
| 2 |
Thickness Dependence of Oxide Wearout Dumin DJ Journal of the Electrochemical Society, 143(11), 3736, 1996 |