검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Interaction of point defects with impurities in the Si-SiO2 system and its influence on the properties of the interface Kropman D, Mellikov E, Opik A, Lott K, Karner T, Heinmaa I, Laas T, Medvid A, Skorupa W, Prucnal S, Rebohle L, Zvyagin S, Cizmar E, Ozerov M, Wosnitza J Thin Solid Films, 518(9), 2374, 2010 |