검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Data retention under gate stress on a NVM array Djenadi R, Micolau G, Postel-Pellerin J, Chiquet P, Laffont R, Ogier JL, Regnier A, Lalande F, Melkonian J Solid-State Electronics, 78, 80, 2012 |
| 2 |
New EEPROM concept for single bit operation Raguet JR, Laffont R, Bouchakour R, Bidal V, Regnier A, Mirabel JM Solid-State Electronics, 52(10), 1525, 2008 |
| 3 |
An experimental method allowing quantifying and localizing failed cells of an EEPROM CAST after a retention test Le Roux C, Lopez L, Firiti A, Ogier JL, Lalande F, Laffont R, Micolau G Solid-State Electronics, 52(10), 1550, 2008 |