검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Quantitative analysis by in situ synchrotron X-ray radiography of the evolution of the mushy zone in a fixed temperature gradient Salloum-Abou-Jaoude G, Reinhart G, Combeau H, Zaloznik M, Lafford TA, Nguyen-Thi H Journal of Crystal Growth, 411, 88, 2015 |
| 2 |
Segregation, precipitation and dislocation generation between seeds in directionally solidified mono-like silicon for photovoltaic applications Tsoutsouva MG, Oliveira VA, Camel D, Thi TNT, Baruchel J, Marie B, Lafford TA Journal of Crystal Growth, 401, 397, 2014 |
| 3 |
The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers - Preliminary results from the second round-robin Matyi RJ, Depero LE, Bontempi E, Colombi P, Gibaud A, Jergel M, Krumrey M, Lafford TA, Lamperti A, Meduna M, Van der Lee A, Wiemer C Thin Solid Films, 516(22), 7962, 2008 |
| 4 |
Effect of thickness on structural and electrical properties of GaN films grown on SiN-treated sapphire Bchetnia A, Toure A, Lafford TA, Benzarti Z, Halidou I, Habchi MM, El Jani B Journal of Crystal Growth, 308(2), 283, 2007 |