검색결과 : 1건
No. | Article |
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1 |
Leakage current mechanism of metal-Ta2O5-metal capacitors for memory device applications Lai BCM, Lee JYM Journal of the Electrochemical Society, 146(1), 266, 1999 |
No. | Article |
---|---|
1 |
Leakage current mechanism of metal-Ta2O5-metal capacitors for memory device applications Lai BCM, Lee JYM Journal of the Electrochemical Society, 146(1), 266, 1999 |