검색결과 : 1건
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Defect structure originating from threading dislocations within the GaN film grown on a convex patterned sapphire substrate Oh TS, Jeong H, Lee YS, Seo TH, Park AH, Kim H, Lee KJ, Jeong MS, Suh EK Thin Solid Films, 519(8), 2398, 2011 |