화학공학소재연구정보센터
검색결과 : 15건
No. Article
1 Introduction: Micro and nanotechnologies
Launois H
Applied Surface Science, 164, 1, 2000
2 Electron beam lithography: resolution limits and applications
Vieu C, Carcenac F, Pepin A, Chen Y, Mejias M, Lebib A, Manin-Ferlazzo L, Couraud L, Launois H
Applied Surface Science, 164, 111, 2000
3 Patterning of planar magnetic nanostructures by ion irradiation
Devolder T, Chappert C, Chen Y, Cambril E, Launois H, Bernas H, Ferre J, Jamet JP
Journal of Vacuum Science & Technology B, 17(6), 3177, 1999
4 Fabrication of three-dimensional microstructures by high resolution x-ray lithography
Cuisin C, Chen Y, Decanini D, Chelnokov A, Carcenac F, Madouri A, Lourtioz JM, Launois H
Journal of Vacuum Science & Technology B, 17(6), 3444, 1999
5 Edge diffraction enhanced printability in x-ray nanolithography
Chen Y, Simon G, Haghiri-Gosnet AM, Carcenac F, Decanini D, Rousseaux F, Launois H
Journal of Vacuum Science & Technology B, 16(6), 3521, 1998
6 Coulomb blockade devices fabricated by liquid metal ion source droplet deposition
Vieu C, Pepin A, Gierak J, David C, Jin Y, Carcenac F, Launois H
Journal of Vacuum Science & Technology B, 16(6), 3789, 1998
7 Fabrication of magnetic submicron-wire channels for the investigation of magnetization reversal
Chen Y, Kottler V, Carcenac F, Rene JF, Essaidi N, Chappert C, Launois H
Journal of Vacuum Science & Technology B, 16(6), 3830, 1998
8 Evidence of Stress Dependence in SiO2/Si3N4 Encapsulation-Based Layer Disordering of GaAs/AlGaAs Quantum-Well Heterostructures
Pepin A, Vieu C, Schneider M, Launois H, Nissim Y
Journal of Vacuum Science & Technology B, 15(1), 142, 1997
9 Optimization of experimental operating parameters for very high resolution focused ion beam applications
Gierak J, Vieu C, Schneider M, Launois H, Ben Assayag G, Septier A
Journal of Vacuum Science & Technology B, 15(6), 2373, 1997
10 Sub-20 nm x-ray nanolithography using conventional mask technologies on monochromatized synchrotron radiation
Simon G, Haghiri-Gosnet AM, Bourneix J, Decanini D, Chen Y, Rousseaux F, Launois H, Vidal B
Journal of Vacuum Science & Technology B, 15(6), 2489, 1997