1 |
Stresses evaluation by transmission energy dispersive X-ray diffraction using industrial radiography equipment Lavelle B, Vendier L, Auriol O Materials Science Forum, 490-491, 149, 2005 |
2 |
Effect of sputtering pressure on residual stress in Ni films using energy-dispersive x-ray diffraction Alfonso JA, Greaves ED, Lavelle B, Sajo-Bohus L Journal of Vacuum Science & Technology A, 21(4), 846, 2003 |
3 |
A new device for in situ residual stress measurement during fatigue testing Alam AM, Chieragatti R, Lavelle B Materials Science Forum, 347-3, 358, 2000 |
4 |
Modelisation of strains measured by X-ray diffraction in composites with spherical particles Durand L, Lavelle B, Drira-Halouani R, Altibelli A Materials Science Forum, 347-3, 536, 2000 |
5 |
Evaluation of residual stresses near a welded zone by transmission energy dispersive X-ray diffraction Lavelle B, Jaud J Materials Science Forum, 347-3, 670, 2000 |
6 |
Residual stresses analysis by X-ray diffraction in terms of equivalent applied stress on Ni-(Al2O3, SiO2) particle composites Drira-Halouani R, Lavelle B Journal of Materials Science Letters, 16(23), 1879, 1997 |