검색결과 : 8건
No. | Article |
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1 |
Theoretical and experimental study of a thermal damper based on a CNT/PCM composite structure for transient electronic cooling Kinkelin C, Lips S, Soupremanien U, Remondiere V, Dijon J, Le Poche H, Oilier E, Zegaoui M, Rolland N, Rolland PA, Lhostis S, Descouts B, Kaplan Y, Lefevre F Energy Conversion and Management, 142, 257, 2017 |
2 |
Soft X-ray photoemission study of nitrogen diffusion in TiN/HfO:N gate stacks Martinez E, Gaumer C, Lhostis S, Licitra C, Silly M, Sirotti F, Renault O Applied Surface Science, 258(6), 2107, 2012 |
3 |
Impact of Oxidation on Ge2Sb2Te5 and GeTe Phase-Change Properties Gourvest E, Pelissier B, Vallee C, Roule A, Lhostis S, Maitrejean S Journal of the Electrochemical Society, 159(4), H373, 2012 |
4 |
Carbon-doped GeTe: A promising material for Phase-Change Memories Beneventi GB, Perniola L, Sousa V, Gourvest E, Maitrejean S, Bastien JC, Bastard A, Hyot B, Fargeix A, Jahan C, Nodin JF, Persico A, Fantini A, Blachier D, Toffoli A, Loubriat S, Roule A, Lhostis S, Feldis H, Reimbold G, Billon T, De Salvo B, Larcher L, Pavan P, Bensahel D, Mazoyer P, Annunziata R, Zuliani P, Boulanger F Solid-State Electronics, 65-66, 197, 2011 |
5 |
Chemical and Structural Properties of a TaN/HfO2 Gate Stack Processed Using Atomic Vapor Deposition Gaumer C, Martinez E, Lhostis S, Wiemer C, Perego M, Loup V, Lafond D, Fabbri JM Journal of the Electrochemical Society, 156(7), G78, 2009 |
6 |
Electrical and Chemical Properties of the HfO2/SiO2/Si Stack: Impact of HfO2 Thickness and Thermal Budget Martinez E, Leroux C, Benedetto N, Gaumer C, Charbonnier M, Licitra C, Guedj C, Fillot F, Lhostis S Journal of the Electrochemical Society, 156(8), G120, 2009 |
7 |
Addition of yttrium into HfO2 films: Microstructure and electrical properties Dubourdieu C, Rauwel E, Roussel H, Ducroquet F, Hollander B, Rossell M, Van Tendeloo G, Lhostis S, Rushworth S Journal of Vacuum Science & Technology A, 27(3), 503, 2009 |
8 |
Thin films of the double perovskite Sr2FeMoO6 deposited by pulsed laser deposition Borges RR, Lhostis S, Bari MA, Versluijs JJ, Lunney JG, Coey JMD, Besse M, Contour JP Thin Solid Films, 429(1-2), 5, 2003 |