검색결과 : 2건
No. | Article |
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1 |
Silicon Metal-Oxide-Semiconductor Field-Effect Transistor with Gate Structures Defined by Scanned Probe Lithography Hagedom MS, Litfin DD, Price GM, Gordon AE, Higman TK Journal of Vacuum Science & Technology B, 14(6), 4153, 1996 |
2 |
Mechanisms of Surface Anodization Produced by Scanning Probe Microscopes Gordon AE, Fayfield RT, Litfin DD, Higman TK Journal of Vacuum Science & Technology B, 13(6), 2805, 1995 |