화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Silicon Metal-Oxide-Semiconductor Field-Effect Transistor with Gate Structures Defined by Scanned Probe Lithography
Hagedom MS, Litfin DD, Price GM, Gordon AE, Higman TK
Journal of Vacuum Science & Technology B, 14(6), 4153, 1996
2 Mechanisms of Surface Anodization Produced by Scanning Probe Microscopes
Gordon AE, Fayfield RT, Litfin DD, Higman TK
Journal of Vacuum Science & Technology B, 13(6), 2805, 1995