검색결과 : 37건
| No. | Article |
|---|---|
| 1 |
Spectroellipsometric detection of silicon substrate damage caused by radiofrequency sputtering of niobium oxide Lohner T, Serenyi M, Szilagyi E, Zolnai Z, Czigany Z, Khanh NQ, Petrik P, Fried M Applied Surface Science, 421, 636, 2017 |
| 2 |
Optical properties of Zr and ZrO2 Petrik P, Sulyok A, Novotny T, Perez-Fero E, Kalas B, Agocs E, Lohner T, Lehninger D, Khomenkova L, Nagy R, Heitmann J, Menyhard M, Hozer Z Applied Surface Science, 421, 744, 2017 |
| 3 |
Resolving lateral and vertical structures by ellipsometry using wavelength range scan Petrik P, Agocs E, Volk J, Lukacs I, Fodor B, Kozma P, Lohner T, Oh S, Wakayama Y, Nagata T, Fried M Thin Solid Films, 571, 579, 2014 |
| 4 |
Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration Lohner T, Agocs E, Petrik P, Zolnai Z, Szilagyi E, Kovacs I, Szokefalvi-Nagy Z, Toth L, Toth AL, Illes L, Barsony I Thin Solid Films, 571, 715, 2014 |
| 5 |
Integration of large-scale hydrogen storages in a low-carbon electricity generation system Lohner T, D'Aveni A, Dehouche Z, Johnson P International Journal of Hydrogen Energy, 38(34), 14638, 2013 |
| 6 |
M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications Banyasz I, Berneschi S, Fried M, Lohner T, Conti GN, Righini GC, Pelli S, Zolnai Z Thin Solid Films, 541, 3, 2013 |
| 7 |
Interfacial properties of hydrophilized poly(lactic-co-glycolic acid) layers with various thicknesses Gyulai G, Penzes CB, Mohai M, Lohner T, Petrik P, Kurunczi S, Kiss E Journal of Colloid and Interface Science, 362(2), 600, 2011 |
| 8 |
Characterization of damage structure in ion implanted SiC using high photon energy synchrotron ellipsometry Petrik P, Zolnai Z, Polgar O, Fried M, Betyak Z, Agocs E, Lohner T, Werner C, Roppischer M, Cobet C Thin Solid Films, 519(9), 2791, 2011 |
| 9 |
Spectroellipsometric and ion beam analytical investigation of nanocrystalline diamond layers Lohner T, Csikvari P, Khanh NQ, David S, Horvath ZE, Petrik P, Hars G Thin Solid Films, 519(9), 2806, 2011 |
| 10 |
Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si Mohacsi I, Petrik P, Fried M, Lohner T, van den Berg JA, Reading MA, Giubertoni D, Barozzi M, Parisini A Thin Solid Films, 519(9), 2847, 2011 |