검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
High accuracy IR ellipsometer working with a Ge Brewster angle reflection polarizer and grid analyzer Luttmann M, Stehle JL, Defranoux C, Piel JP Thin Solid Films, 313-314, 631, 1998 |
| 2 |
Combined characterization of conductive materials by infrared spectroscopic ellipsometry and grazing X-ray reflectance Boher P, Luttmann M, Stehle JL, Hennet L Thin Solid Films, 319(1-2), 67, 1998 |