검색결과 : 11건
No. | Article |
---|---|
1 |
Ubiquitin Designer Proteins as a New Additive Generation toward Controlling Crystallization Ruiz-Agudo C, Lutz J, Keckeis P, King M, Marx A, Gebauer D Journal of the American Chemical Society, 141(31), 12240, 2019 |
2 |
Microdeletions within the hydrophobic core region of cellular prion protein alter its topology and metabolism Lutz J, Brabeck C, Niemann HH, Kloz U, Korth C, Lingappa VR, Burkle A Biochemical and Biophysical Research Communications, 393(3), 439, 2010 |
3 |
Marker experiments to determine diffusing species and diffusion path in medical Nitinol alloys Lutz J, Lindner JKN, Mandl S Applied Surface Science, 255(4), 1107, 2008 |
4 |
Glutamate induces apoptosis in cultured spiral ganglion explants Steinbach S, Lutz J Biochemical and Biophysical Research Communications, 357(1), 14, 2007 |
5 |
Life-cycle cost analysis of energy efficiency design options for residential furnaces and boilers Lutz J, Lekov A, Chan P, Whitehead CD, Meyers S, McMahon J Energy, 31(2-3), 311, 2006 |
6 |
Irradiation-induced deep levels in silicon for power device tailoring Siemieniec R, Niedernostheide FJ, Schulze HJ, Sudkamp W, Kellner-Werdehausen U, Lutz J Journal of the Electrochemical Society, 153(2), G108, 2006 |
7 |
Determination of parameters of radiation induced traps in silicon Siemieniec R, Sudkamp W, Lutz J Solid-State Electronics, 46(6), 891, 2002 |
8 |
Experimental evaluation of an optimized radiation cooling geometry for ion projection lithography masks Torres JL, Nounu HN, Wasson JR, Wolfe JC, Lutz J, Haugeneder E, Loschner H, Stengl G, Kaesmaier R Journal of Vacuum Science & Technology B, 18(6), 3207, 2000 |
9 |
Dynamic avalanche in Si power diodes and impact ionization at the nn(+) junction Domeij M, Breitholtz B, Lutz J, Ostling M Solid-State Electronics, 44(3), 477, 2000 |
10 |
Optimization of the temperature distribution across stencil mask membranes under ion beam exposure Kim B, Engelstad R, Lovell E, Chalupka A, Haugeneder E, Lammer G, Loschner H, Lutz J, Stengl G Journal of Vacuum Science & Technology B, 16(6), 3602, 1998 |