검색결과 : 20건
No. | Article |
---|---|
1 |
Interfacial influence on electrical injection and transport characterization of CoFeB vertical bar MgO vertical bar GaAs-InGaAs quantum wells hetero-structure Tian Y, Zhang C, Xiao C, Wang R, Xu L, Devaux X, Renucci P, Xu B, Liang S, Yang C, Lu Y Applied Surface Science, 473, 230, 2019 |
2 |
Highly uniform and reliable resistive switching characteristics of a Ni/WOx/p(+)-Si memory device Kim TH, Kim S, Kim H, Kim MH, Bang S, Cho S, Park BG Solid-State Electronics, 140, 51, 2018 |
3 |
Metal-insulator-SiC Schottky structures using HfO2 and TiO2 dielectrics Kaufmann IR, Pick A, Pereira MB, Boudinov H Thin Solid Films, 621, 184, 2017 |
4 |
Ultra-thin CdS for highly performing chalcogenides thin film based solar cells Sanchez Y, Espindola-Rodriguez M, Xie H, Lopez-Marino S, Neuschitzer M, Giraldo S, Dimitrievska M, Placidi M, Izquierdo-Roca V, Pulgarin-Agudelo PA, Vigil-Galan O, Saucedo E Solar Energy Materials and Solar Cells, 158, 138, 2016 |
5 |
TCAD simulation of tunneling leakage current in CaF2/Si(111) MIS structures Illarionov YY, Vexler MI, Karner M, Tyaginov SE, Cervenka J, Grasser T Current Applied Physics, 15(2), 78, 2015 |
6 |
A wire-form emitter metal-insulator-semiconductor tunnel junction Vexler MI Current Applied Physics, 14(3), 306, 2014 |
7 |
Low energy hydrogen sensor Linke S, Dallmer M, Werner R, Moritz W International Journal of Hydrogen Energy, 37(22), 17523, 2012 |
8 |
Electrical characteristics of insulating aluminum nitride MIS nanostructures Abdallah B, Al-Khawaja S, Alkhawwam A Applied Surface Science, 258(1), 419, 2011 |
9 |
Inter-diffusion of cobalt and silicon through an ultra thin aluminum oxide layer El Asri T, Raissi M, Vizzini S, El Maachi A, Ameziane EL, d'Avitaya FA, Lazzari JL, Coudreau C, Oughaddou H, Aufray B, Kaddouri A Applied Surface Science, 256(9), 2731, 2010 |
10 |
Simulation of hole and electron tunnel currents in MIS devices adopting the symmetric Franz-type dispersion relation for the charged carriers in thin insulators Vexler MI, Kuligk A, Meinerzhagen B Solid-State Electronics, 53(3), 364, 2009 |