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Be/Al-based multilayer mirrors with improved reflection and spectral selectivity for solar astronomy above 17 nm wavelength Chkhalo NI, Pariev DE, Polkovnikov VN, Salashchenko NN, Shaposhnikov A, Stroulea IL, Svechnikov MV, Vainer YA, Zuev SY Thin Solid Films, 631, 106, 2017 |
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Thermal stability of B-based multilayer mirrors for next generation lithography Naujok P, Murray K, Yulin S, Patzig C, Kaiser N, Tunnermann A Thin Solid Films, 642, 252, 2017 |
3 |
Interface characterization in B-based multilayer mirrors for next generation lithography Naujok P, Yulin S, Muller R, Kaiser N, Tunnermann A Thin Solid Films, 612, 414, 2016 |
4 |
Structure, thermal stability and extreme ultraviolet performance of Mo/Y multilayers Xu DC, Huang QS, Wen MW, Wang ZS Thin Solid Films, 592, 266, 2015 |
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Analytical comparison of parallel beam and Bragg-Brentano diffractometer performances Verman B, Kim B Materials Science Forum, 443-4, 167, 2004 |
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Structural investigations on ultrathin Mo layers in a-Si : H with emphasis on the island-continuous layer transition Lohmann M, Klabunde F, Blasing J, Veit P, Drusedau T Thin Solid Films, 342(1-2), 127, 1999 |
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Core-Electron Excitation for Si Photochemical Process Using High-Intensity Monochromatized Synchrotron-Radiation Iba Y, Sugita Y, Nara Y Journal of Vacuum Science & Technology A, 15(5), 2561, 1997 |