화학공학소재연구정보센터
검색결과 : 13건
No. Article
1 Treatment of vinasses by electrocoagulation-electroflotation using the Taguchi method
Davila JA, Machuca F, Marrianga N
Electrochimica Acta, 56(22), 7433, 2011
2 A comparison of solar photocatalytic inactivation of waterborne E-coli using tris (2,2'-bipyridineftuthenium(II), rose bengal, and TiO2
Rengifo-Herrera JA, Sanabria J, Machuca F, Dierolf CF, Pulgarin C, Orellana G
Journal of Solar Energy Engineering-Transactions of The ASME, 129(1), 135, 2007
3 Subpicosecond jitter in picosecond electron bunches
Ioakeimidi K, Gradinaru S, Liu Z, Machuca F, Nielsen JF, Aldana R, Bolton RP, Clendenin J, Leheny R, Pease RFW
Journal of Vacuum Science & Technology B, 23(1), 196, 2005
4 Negative electron affinity group III-nitride photocathode demonstrated as a high performance electron source
Machuca F, Liu Z, Maldonado JR, Coyle ST
Journal of Vacuum Science & Technology B, 22(6), 3565, 2004
5 Preparation of clean GaAs(100) studied by synchrotron radiation photoemission
Liu Z, Sun Y, Machuca F, Pianetta P, Spicer WE, Pease RFW
Journal of Vacuum Science & Technology A, 21(1), 212, 2003
6 Preparation of clean InP(100) surfaces studied by synchrotron radiation photoemission
Sun Y, Liu Z, Machuca F, Pianetta P, Spicer WE
Journal of Vacuum Science & Technology A, 21(1), 219, 2003
7 Oxygen species in Cs/O activated gallium nitride (GaN) negative electron affinity photocathodes
Machuca F, Liu Z, Sun Y, Pianetta P, Spicer WE, Pease RFW
Journal of Vacuum Science & Technology B, 21(4), 1863, 2003
8 Optimization and characterization of III-V surface cleaning
Liu Z, Sun Y, Machuca F, Pianetta P, Spicer WE, Pease RFW
Journal of Vacuum Science & Technology B, 21(4), 1953, 2003
9 Simple method for cleaning gallium nitride (0001)
Machuca F, Liu Z, Sun Y, Pianetta R, Spicer WE, Pease RFW
Journal of Vacuum Science & Technology A, 20(5), 1784, 2002
10 Role of oxygen in semiconductor negative electron affinity photocathodes
Machuca F, Liu Z, Sun Y, Pianetta P, Spicer WE, Pease RFW
Journal of Vacuum Science & Technology B, 20(6), 2721, 2002