화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 High-resolution two-dimensional dopant characterization using secondary ion mass spectrometry
Ukraintsev VA, Chen PJ, Gray JT, Machala CF, Magel LK, Chang MC
Journal of Vacuum Science & Technology B, 18(1), 580, 2000
2 A new process for depositing tungsten nitride thin films
Lu JP, Hsu WY, Luttmer JD, Magel LK, Tsai HL
Journal of the Electrochemical Society, 145(2), L21, 1998
3 Thermal stability of Al/barrier/TiSix multilayer structures
Lu JP, Hsu WY, Hong QZ, Dixit GA, Luttmer JD, Havemann RH, Chen PJ, Tsai HL, Magel LK
Thin Solid Films, 320(1), 20, 1998
4 Effect of Ar Sputter Etch on the Texture of Ti and Al/Tin/Ti Metal Stack
Hsu WY, Hong QZ, Liu HY, Douglas M, Taylor K, Magel LK, Luttmer JD, Havemann RH
Journal of the Electrochemical Society, 144(9), L248, 1997
5 A Novel Process for Fabricating Conformal and Stable Tin-Based Barrier
Lu JP, Hsu WY, Hong QZ, Dixit GA, Luttmer JD, Havemann RH, Magel LK
Journal of the Electrochemical Society, 143(12), L279, 1996